Defect-oriented testing for nano-metric CMOS VLSI circuits

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Material type: Text

TextSeries: Frontiers electronic testingPublication details: New Delhi; Springer; 2007Edition: 2Description: xxi, 328pISBN:

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Holdings
Item type	Home library	Call number	Status	Barcode
BOOKS	AMRITA SCHOOL OF ENGINEERING	621.38.049 CMOS/P71 (Browse shelf(Opens below))	Available	45970

Reprint year 2010. Includes index

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